Prof. Hao Ying
Wayne State University, IEEE Fellow, USA
Dr. Zi-Peng Wang
Beijing University of Technology, Beijing, China
Prof. Cristian Randieri
University eCampus, Italy
Prof. Paolo Mercorelli
Leuphana University of Luneburg, Germany
Prof. Rui Alexandre de Matos Araujo
University of Coimbra, Portugal
Dr. Nikunj Tahilramani
NSIT-IFSCS (Affiliated to National Forensic Sciences University),IEEE Senior Member, India
Prof. Hanshen Li
Shanghai Jiao Tong University, China